Picosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 1999, Pages 35-38

  McManus, Moyra ^a   Sanda, Pia ^a   Steen, Steven ^a   Knebel, Dan ^a   Manzer, Dennis ^a   Polonsky, Stas ^a   Huott, Bill ^b   Wilson, Steve ^b   Pelella, Tony ^b   Chan, Yuen ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PICOSECOND IMAGING CIRCUIT ANALYSIS (PICA); PROGRAMMABLE ARRAY BUILT-IN SELF TEST (RAMBIST);

ARRAYS; CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; FAILURE ANALYSIS; IMAGING SYSTEMS; INFRARED SPECTROSCOPY; ION BEAMS; VLSI CIRCUITS;

MICROPROCESSOR CHIPS;

EID: 10744231849     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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2. W. Huott, T.J. Siegel, T. Lo, P. Patel, Programmable Computer System Element with Built-in Self Test Method and Apparatus for Repair During Power-On, U.S. Patents 5659551 and 5805789, 1997.
3. P.O. Shephard III, W. Huott, P.R. Turgeon, R.W. Berry Jr., P.Patel, G. Yasar, J. Hanley, F.J. Cox, Programmable Built-in Self. Test Method and Controller for Arrays, U.S. Patent 5633877, 1997.
4. J.A. Kash, J.C. Tsang, D.R. Knebel, D.P. Vallett, Non-Invasive Backside Failure Analysis of Integrated Circuits by Time-Dependent Light Emission: Picosecond Imaging Circuit Analysis, Conference Proceedings from the 24th International Symposium for Testing and Failure Analysis, p. 483-489, 1998.
5. Dan Knebel, Pia Sanda, Moyra Me Manus, J. A. Kash, J. C. Tsang, Dave Vallett, Leendert Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika, Diagnosis and Characterization of Timing-Related Defects by Time-Dependent Light Emission, Proceedings of the International Test Conference, pp. 733-739, 1998.
6. J.C. Tsang and J.A. Kash, Appl. Phys. Lett. 70, p.889-891, 1997.
7. P.N. Sanda, D.R. Knebel, J.A. Kash, H.F. Casal, J.C. Tsang, E. Seewann, and M. Papermaster, Picosecond Imaging Circuit Analysis of the POWERS Clock Distribution, Digest of the IEEE International Solid-State Circuits Conf. 372, 1999.