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Volumn 276, Issue 3-4, 2005, Pages 534-540

In situ characterization of lattice relaxation of the BaTiO 3/LaNiO3 superlattices epitaxially grown on SrTiO 3 substrates

Author keywords

A1. In situ X ray diffraction and reflectivity; A1. Interface; A1. Superlattices; A1. Surface structure

Indexed keywords

EPITAXIAL GROWTH; LANTHANUM COMPOUNDS; STRONTIUM COMPOUNDS; SUPERLATTICES; SURFACE STRUCTURE; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

EID: 15344344223     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.11.425     Document Type: Article
Times cited : (11)

References (42)
  • 25
    • 0003427458 scopus 로고
    • Addison-Wesley Publishing Company, Inc. Reading, MA
    • B.D. Cullity Elements of X-ray Diffraction 1978 Addison-Wesley Publishing Company, Inc. Reading, MA p. 285
    • (1978) Elements of X-ray Diffraction
    • Cullity, B.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.