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Journal of Materials Research

Volumn 15, Issue 12, 2000, Pages 2606-2611

Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO3 thin films on Si substrates

(4) Lee, Hsin Yi a Liang, K S a Lee, Chih Hao b Wu, Tai Bor b

a Synchrotron Radiation Research Center (China)

b NATIONAL TSING HUA UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; LANTHANUM COMPOUNDS; MOLECULAR ORIENTATION; NUCLEATION; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; SPUTTER DEPOSITION; SUBSTRATES; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

X-RAY REFLECTIVITY;

THIN FILMS;

EID: 0034582823 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2000.0374 Document Type: Article

Times cited : (14)

References (37)

1
- 84957229108
- (1991) J. Vac. Sci. Technol. A , vol.9 , pp. 414
- Heartling, G.H.¹

2
- 0000665450
- (1990) Science , vol.247 , pp. 105
- Sayer, M.¹ Sreenivas, K.²

3
- 0002468625
- (1992) Ceram. Bull. , vol.71 , pp. 85
- Sheppard, L.M.¹

4
- 0027098461
- (1992) Ferroelectrics , vol.128 , pp. 265
- Larsen, P.K.¹ Cuppens, R.² Spierings, G.A.C.M.³

5
- 0001772777
- Ferroelectric Thin Films II, edited by A.I. Kingor, E.R. Myers, and B. Tuttle (Pittsburgh, PA)
- (1992) Mater. Res. Soc. Symp. Proc. , vol.243 , pp. 123
- Bruchhaus, R.¹ Pitzer, D.² Eibl, O.³ Scheithauer, V.⁴ Hoesler, W.⁵

6
- 0028468223
- (1994) J. Mater. Res. , vol.9 , pp. 1879
- Jiang, M.C.¹ Wu, T.B.²

7
- 35348846979
- (1989) Science , vol.246 , pp. 1400
- Scott, J.F.¹ Paz de Araujo, C.A.²

8
- 0027874596
- Ferroelectric Thin Films III, edited by E.R. Mayers, B.A. Tuttle, S.B. Desu, and P.K. Larsen (Pittsburgh, PA)
- (1993) Mater. Res. Soc. Symp. Proc. , vol.310 , pp. 145
- Eom, C.B.¹ Dover, R.B.V.² Phillips, J.M.³ Fleming, R.M.⁴ Cava, R.J.⁵ Marshall, J.H.⁶ Werder, D.J.⁷ Chen, C.H.⁸ Fork, D.K.⁹

9
- 0027667757
- (1993) J. Electrochem. Soc. , vol.140 , pp. 2640
- Vijat, D.P.¹ Desu, S.B.²

10
- 0028512460
- (1994) Jpn. J. Appl. Phys. , vol.33 , pp. 5207
- Nakamuna, T.¹ Nakao, Y.² Kamisawa, A.³ Takasu, H.⁴

11
- 21544439412
- (1992) Appl. Phys. Lett. , vol.61 , pp. 1537
- Ramesh, R.¹ Chan, W.K.² Wilkens, B.³ Gilchrist, H.⁴ Sands, T.⁵ Tarascon, J.M.⁶ Keramidas, V.G.⁷ Fork, D.K.⁸ Lee, J.⁹ Safari, A.¹⁰

12
- 85121089303
- (1991) Solid State Commun. , vol.79 , pp. 591
- Rajeex, K.P.¹ Shivakuma, G.V.² Raychaudhmi, A.K.³

13
- 36449004513
- (1993) Appl. Phys. Lett. , vol.62 , pp. 1233
- Satyakahmi, K.M.¹ Mallha, R.M.² Ramanathan, K.V.³ Wu, X.D.⁴ Brainard, B.⁵ Gautier, D.C.⁶ Vasanthacharya, N.Y.⁷ Hegde, M.S.⁸

14
- 0028517653
- (1994) J. Mater. Sci. , vol.29 , pp. 5115
- Ichinose, H.¹ Nagano, M.² Katsuki, H.³ Takag, H.⁴

15
- 0000991979
- (1957) J. Am. Chem. Soc. , vol.70 , pp. 4911
- Wold, A.¹ Post, B.² Banks, E.³

16
- 5344243343
- (1975) Jpn. J. Appl. Phys. , vol.14 , pp. 330
- Obayashi, H.¹ Kudo, T.²

17
- 36449004207
- (1995) Appl. Phys. Lett. , vol.66 , pp. 2643
- Yang, C.C.¹ Chen, M.S.² Hong, T.J.³ Wu, C.M.⁴ Wu, J.M.⁵ Wu, T.B.⁶

18
- 0000987254
- (1996) J. Appl. Phys. , vol.80 , pp. 2175
- Lee, H.-Y.¹ Wu, T.-B.² Lee, J.-F.³

19
- 0029342815
- (1995) Jpn. J. Appl. Phys. , vol.34 , pp. 3647
- Shyu, M.J.¹ Hong, T.J.² Wu, T.B.³

20
- 0029309383
- (1995) Mater. Lett. , vol.23 , pp. 221
- Shyu, M.J.¹ Hong, T.J.² Wu, T.B.³

21
- 0029371320
- (1995) Jpn. J. Appl. Phys. , vol.34 , pp. 4870
- Chen, M.S.¹ Wu, J.M.² Wu, T.B.³

22
- 0009286140
- (1996) J. Appl. Phys. , vol.68 , pp. 1430
- Chen, M.S.¹ Wu, T.B.² Wu, I.M.³

23
- 0028262021
- (1994) Mater. Chem. Phys. , vol.36 , pp. 337
- Wu, T.B.¹ Hong, T.J.² Jiang, M.C.³

24
- 0031273739
- (1997) J. Mater. Res. , vol.12 , pp. 3165
- Lee, H.-Y.¹ Wu, T.-B.²

25
- 85121089092
- M.S. Thesis, National Tsing Hua University, Hsinchu, Taiwan, Republic of China, in Chinese
- (1996)
- Liu, Y.W.¹

26
- 0023089427
- (1987) J. Phys. D , vol.20 , pp. 61
- Cowley, R.A.¹ Ryan, T.W.²

27
- 26144449160
- (1954) Phys. Rev. , vol.95 , pp. 359
- Parratt, L.G.¹

28
- 0000096033
- (1988) Phys. Rev. A , vol.38 , pp. 2457
- Braslau, A.¹ Pershan, P.S.² Swislow, G.³ Ocko, B.M.⁴ Als-Nielsen, J.⁵

29
- 0001400304
- (1988) Phys. Rev. B , vol.38 , pp. 1016
- Heald, S.M.¹ Chen, H.² Tranquada, J.M.³

30
- 36549091780
- (1988) J. Appl. Phys. , vol.63 , pp. 1936
- Lucas, C.A.¹ Hatton, P.D.² Bates, S.³ Ryan, W.⁴ Miles, S.⁵ Tanner, B.K.⁶

31
- 0009228892
- (1989) J. Appl. Phys. , vol.66 , pp. 1793
- Chen, H.¹ Heald, S.M.²

32
- 35949009089
- (1990) Phys. Rev. B , vol.41 , pp. 1111
- Tidswell, I.M.¹ Ocko, B.M.² Pershan, P.S.³ Wasserman, S.R.⁴ Whitesides, G.M.⁵ Axe, J.D.⁶

33
- 0009297901
- Advances in Surfaces and Thin-Film Diffraction, edited by T.C. Huang, P.I. Cohen, and D.J. Eaglesham (Pittsburgh, PA)
- (1991) Mater. Res. Soc. Symp. Proc. , vol.208 , pp. 113
- Bowen, D.K.¹ Loxley, N.² Tanner, B.K.³ Cooke, M.L.⁴ Capano, M.A.⁵

34
- 0031147325
- (1997) J. Appl. Phys. , vol.81 , pp. 6126
- Je, J.H.¹ Noh, D.Y.² Kim, H.K.³ Liang, K.S.⁴

35
- 0343277085
- JCPDS 33-710, Hahn, Institut für Kristallografie, Technische Hochschule, Aachen, Germany
- (1981) JCPDS Grant-in-Report
- Wustenberg, H.¹

36
- 36449008567
- (1993) J. Appl. Phys. , vol.74 , pp. 1692
- Oh, U.C.¹ Je, J.H.²

37
- 0030232573
- (1996) Jpn. J. Appl. Phys. , vol.35 , pp. 4743
- Tseng, T.F.¹ Yang, C.C.² Liu, K.S.³ Wu, J.M.⁴ Wu, T.B.⁵ Lin, I.N.⁶

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