Scanning Auger microscopy: Recent progress in data analysis and instrumentation

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 277-282

  Jacka, Marcus ^a  

^a UNIVERSITY OF YORK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; ELECTRON ENERGY LEVELS;

SCANNING AUGER MICROSCOPY (SAM);

MICROSCOPIC EXAMINATION;

EID: 0005799228     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00281-4     Document Type: Article

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