First Observation of InxGa1-xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM

Microscopy and Microanalysis

Volumn 10, Issue 1, 2004, Pages 139-145

  Tanaka, Nobuo ^a   Yamasaki, Jun ^a   Fuchi, Shingo ^a   Takeda, Yoshikazu ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

ADF STEM; Cs corrected HRTEM; GaP substrate; InGaas; Quantum dots

Indexed keywords

EID: 1442265283     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040231     Document Type: Conference Paper

References (23)

1. FUCHI, S., NONOGAKI, Y., IGUCHI, T., MORIYA, H., FUJIWARA, Y. & TAKEDA, Y. (2000). Effects of GaP cap layer growth on self-assembled InAs islands grown on GaP(001) by organometallic vapor phase epitaxy. Jpn J Appl Phys 39, 3290-3293.
2. HAIDER, M., ROSE, H., UHLEMANN, S., KABIUS, B. & URBAN, K. (1998). Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope. J Electron Microsc 47, 395-405.
3. HONJO, G. & YAGI, K. (1980). Studies of epitaxial growth of thin films in-situ electron microscopy. In Current Topics in Materials Science, Kaldis, E. (Ed.), pp. 197-304. Amsterdam: North-Holland.
4. HOSOKAWA, F., TOMITA, T., HONDA, T., HARTEL, P. & HAIDER, M. (2003). A spherical aberration-corrected 200 kV TEM. J Electron Microsc 52, 3-10.
5. Hu, J.J. & TANAKA, N. (1998). An approximate multi-beam form of the ellipse in high-resolution transmission electron microscopy. Ultramicroscopy 74, 105-111.
6. ISHIZUKA, K. (1982). Multislice formula for inclined illumination. Acta Cryst A 38, 773-779.
7. JIA, C.E., LENTZEN, M. & URBAN, K. (2003). Atomic-resolution imaging of oxygen in perovskite ceramics. Science 299, 870-872.
8. JIN-PHILLIPP, N.Y. & PHILLIPP, F. (1998). Defect formation in self-assembling quantum dots of InGaAs on GaAs; a case study of direct measurements of local strain from HREM. J Microsc 194, 161-170.
9. KRIVANEK, O.L., DELLBY, N. & LUPINI, A.R. (1999). Toward sub-Å electron beams. Ultramicroscopy 78, 1-11.
10. LENTZEN, M., JAHNEN, B., JIA, C.L., THUST, A., TILLMAN, K. & URBAN, K. (2002). High-resolution images with an aberration-corrected transmission electron microscope. Ultramicroscopy 92, 233-242.
11. NELLIST, P.D. & PENNYCOOK, S.J. (1999). Incoherent imaging using dynamically scattered coherent electrons. Ultramicroscopy 78, 111-124.
12. NONOGAKI, Y., IGUCHI, T., FUICHI, S., FUJIWARA, Y. & TAKEDA, Y. (1998). Nanometer-scale islands grown on GaP(001) by organometallic vapor-phase epitaxy. Appl Surf Sci 130/131, 724-728.
13. OURMAZD, A., TAYLOR, D.W., BODE, M. & KIM, Y. (1989). Quantifying the information content of lattice images. Science 246, 1571-1577.
14. REIMER, L. (1984). Transmission Electron Microscopy. Berlin: Springer.
15. s-corrected TEM, Proceedings of the ICEM-15, Cross, R. (Ed.), Vol. 1, pp. 37-38. Onderstepoort, South Africa: Microscopy Society of South Africa.
16. x/Si(100) studied by TEM and ADF imaging on a newly installed 200 kV TEM/STEM. Inst Phys Conf Ser 168, 373-376.
17. TANAKA, N. & KAWAHARA, M. (2001b). Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium. Mater Sci Eng A 312, 25-30.
18. TANAKA, N., SUZUKI, N., KAWASAKI, M., HATA, S., KUWANO, N. & OKI, K. (2000). High-angle annular dark field STEM of partially ordered Ni-19.5at%Mo alloys. J Physique IV 10, 85-90.
19. 2/Si′ (100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy. J Electron Microsc 52, 69-73.
20. 1-xAs islands on GaAs(001) by high-resolution transmission electron microscopy. Phil Mag 74, 309-315.
21. YAMASAKI, T., KAWASAKI, M., WATANABE, K., HASHIMOTO, I. & SHIOJIRI, M. (2001). Artificial bright spots in atomic-resolution high-angle annular dark field STEM images. J Electron Microsc 50, 517-521.
22. ZEMLIN, F., WEISS, K., SCHISKE, P., KUNATH, W. & HERRMANN, K.H. (1977). Coma-free alignment of high-resolution electron microscopes with the aid of optical diffractograms. Ultramicroscopy 3, 49-60.
23. ZHANG, X.-F. & ZHANG, Z. (Eds.). (2001). Progress in Transmission Electron Microscopy. Berlin: Springer.