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Volumn 32, Issue 1-3, 2004, Pages 265-273

Spectroscopic ellipsometry of grafted poly(dimethylsiloxane) brushes in carbon dioxide

Author keywords

Ellipsometry; Grafted brush; PDMS; Solvent quality; Supercritical carbon dioxide

Indexed keywords

CARBON DIOXIDE; NEUTRONS; REFRACTIVE INDEX; SILICA; SPECTROSCOPIC ANALYSIS; SUPERCRITICAL FLUIDS;

EID: 14344254055     PISSN: 08968446     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.supflu.2004.01.001     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.