Impact of model errors on predicting performance of matching-critical circuits

Midwest Symposium on Circuits and Systems

Volumn 3, Issue , 2000, Pages 1324-1328

  Lan, Mao Feng ^a   Geiger, Randall ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ERRORS; MATHEMATICAL MODELS; MOSFET DEVICES; RANDOM PROCESSES;

ANALOG CIRCUITS; DISTRIBUTED PARAMETER DEVICES; MATCHING CRITICAL CIRCUITS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0034466169     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Characterization and modeling of mismatch in MOS transistors for precision analog design
2. Matching properties of MOS transistors
3. A new current mirror layout technique for improved matching characteristics
4. 2 random walk CMOS DAC