Characterization and modeling of MOSFET mismatch of a deep submicron technology

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2003, Pages 238-243

  Quarantelli, Michele ^a   Saxena, Sharad ^a   Dragone, Nicola ^a   Babcock, Jeff A ^a   Hess, Christopher ^a   Minehane, Seán ^a   Winters, Steve ^a   Chen, Jianjun ^a   Karbasi, Hossein ^a   Guardiani, Carlo ^a  

^a PDF SOLUTIONS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIGITAL TO ANALOG CONVERSION; ELECTRIC CONVERTERS; ELECTRIC POTENTIAL; SILICON WAFERS; SPURIOUS SIGNAL NOISE;

WAFER MEASUREMENT;

MOSFET DEVICES;

EID: 0038303483     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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