Atomic resolution STEM analysis of defects and interfaces in ceramic materials

Micron

Volumn 36, Issue 3, 2005, Pages 219-231

  Klie, R F ^a   Zhu, Y ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

EELS; HAADF; MgB2; SrTiO3; STEM; TiO2 LaAlO3; Z contrast imaging

Indexed keywords

CERAMIC MATERIALS; CRYSTAL ATOMIC STRUCTURE; DEFECTS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); MATERIALS SCIENCE; OPTICAL RESOLVING POWER; SCANNING ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); Z-CONTRAST IMAGING;

TRANSMISSION ELECTRON MICROSCOPY;

ANGUILLIFORMES;

EID: 13944249119     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2004.12.003     Document Type: Review

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