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Volumn 264, Issue 1-3, 2004, Pages 327-333
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Quality improvement of ZnO layer on LT-grown ZnO layer/Si(1 1 1) through a two-step growth using an RF magnetron sputtering
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Author keywords
A1. RF magnetron sputtering; A2. Two step growth; B1. ZnO on LT ZnO
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BINDING ENERGY;
CRYSTAL DEFECTS;
EXCITONS;
MAGNETRON SPUTTERING;
PHOTOLUMINESCENCE;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR LASERS;
X RAY DIFFRACTION ANALYSIS;
ZINC OXIDE;
RF MAGNETRON SPUTTERING;
TWO-STEP GROWTH;
ZNO ON LT-ZNO;
CRYSTAL GROWTH;
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EID: 1342264110
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.01.006 Document Type: Article |
Times cited : (40)
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References (15)
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