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Volumn 94, Issue 5, 2003, Pages 2888-2894

Quantitative comparisons of dissolved hydrogen density and the electrical and optical properties of ZnO

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; ELECTRIC PROPERTIES; HYDROGEN; OPTICAL PROPERTIES;

EID: 0141745997     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1595147     Document Type: Article
Times cited : (149)

References (32)
  • 15
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    • Atomergic Chemetals Corp., 71 Carolyn Blvd., Farmingdale, NY 11735
    • Atomergic Chemetals Corp., 71 Carolyn Blvd., Farmingdale, NY 11735.
  • 16
    • 0141640610 scopus 로고    scopus 로고
    • SCI Engineered Materials, 1145 Chesapeake Ave., Columbus, OH 43212
    • SCI Engineered Materials, 1145 Chesapeake Ave., Columbus, OH 43212.
  • 17
    • 0141864166 scopus 로고    scopus 로고
    • Rubicon Technology, 9931 Franklin Ave., Franklin Park, IL 60131
    • Rubicon Technology, 9931 Franklin Ave., Franklin Park, IL 60131.
  • 22
    • 0141640611 scopus 로고    scopus 로고
    • This analysis was performed at Charles Evans and Associates, 810 Kifer Rd., Sunnyvale, CA 94086
    • This analysis was performed at Charles Evans and Associates, 810 Kifer Rd., Sunnyvale, CA 94086.
  • 23
    • 0004005306 scopus 로고
    • Wiley-Interscience, New York
    • S. M. Sze, Physics of Semiconductor Devices (Wiley-Interscience, New York, 1969), p. 39; the prefactor of the expression for ionized impurity scattering was adjusted to yield agreement with Si and Ge mobility data in the same charge density range.
    • (1969) Physics of Semiconductor Devices , pp. 39
    • Sze, S.M.1
  • 27
    • 0037277330 scopus 로고    scopus 로고
    • Wiley-Interscience, New York
    • S. M. Sze, Physics of Semiconductor Devices (Wiley-Interscience, New York, 1969), p. 34; the conduction band effective mass was taken to be 0.316 (units of the free electron mass) from D. C. Look, R. L. Jones, J. R. Sizelove, N. Y. Garces, N. C. Giles, and L. E. Halliburton, Phys. Status Solidi A 195, 171 (2003).
    • (1969) Physics of Semiconductor Devices , pp. 34
    • Sze, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.