-
1
-
-
0010479690
-
Thin film transistor technologies III
-
Yue Kuo ed
-
S.G. Burns, H.R. Shanks, A.P. Constant, C. Gruber, D. Schmidt, A. Landin, and F. Olympie, Thin Film Transistor Technologies III, Yue Kuo ed., Electrochem. Soc. Proc. Vol. 96-23, 382 (1997).
-
(1997)
Electrochem. Soc. Proc.
, vol.96
, Issue.23
, pp. 382
-
-
Burns, S.G.1
Shanks, H.R.2
Constant, A.P.3
Gruber, C.4
Schmidt, D.5
Landin, A.6
Olympie, F.7
-
3
-
-
8744262971
-
-
P.M. Smith, P.G. Carey, and T.W. Sigmon, Appl. Phys. Lett., 70, 342 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 342
-
-
Smith, P.M.1
Carey, P.G.2
Sigmon, T.W.3
-
4
-
-
0033734517
-
-
D. P. Gosain, T. Noguchi, and S. Usui, Jpn. J. of Appl. Phys. Part 2: Letters, 39, 3AB, L179 (2000).
-
(2000)
Jpn. J. of Appl. Phys. Part 2: Letters
, vol.39
-
-
Gosain, D.P.1
Noguchi, T.2
Usui, S.3
-
5
-
-
0036683875
-
-
S. Inoue, S. Utsunomiya, T. Saeki, and T. Shimoda, IEEE Trans. on Electron Device, 49, 1353 (2002).
-
(2002)
IEEE Trans. on Electron Device
, vol.49
, pp. 1353
-
-
Inoue, S.1
Utsunomiya, S.2
Saeki, T.3
Shimoda, T.4
-
6
-
-
0000390342
-
-
Z. Bao, Y. Feng, A. Dodabalapur, V. R. Raju, and A. J. Lovinger, Chem. Mater., 9, 1299 (1997).
-
(1997)
Chem. Mater.
, vol.9
, pp. 1299
-
-
Bao, Z.1
Feng, Y.2
Dodabalapur, A.3
Raju, V.R.4
Lovinger, A.J.5
-
7
-
-
22244468334
-
-
C. J. Drury, C. M. Mutsaers, C. M. Hart, M. Matters, and D. M. Leeuw, Appl. Phys. Lett., 73, 108 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 108
-
-
Drury, C.J.1
Mutsaers, C.M.2
Hart, C.M.3
Matters, M.4
Leeuw, D.M.5
-
8
-
-
18844470514
-
-
M. G. Kane, J. Campi, M. S. Hammond, F. P. Cuomo, B. Greening, C. D. Sheraw, J. A. Nichols, D. J. Gundlach, J. R. Huang, C.-C. Huang, L. Jia, H. Klauk, and T. N. Jackson, IEEE Electron Dev. Lett., 21, 534 (2000).
-
(2000)
IEEE Electron Dev. Lett.
, vol.21
, pp. 534
-
-
Kane, M.G.1
Campi, J.2
Hammond, M.S.3
Cuomo, F.P.4
Greening, B.5
Sheraw, C.D.6
Nichols, J.A.7
Gundlach, D.J.8
Huang, J.R.9
Huang, C.-C.10
Jia, L.11
Klauk, H.12
Jackson, T.N.13
-
9
-
-
0032257708
-
-
IEEE, New York
-
M. Bonse, D. B. Thomasson, H. Klauk, D. J. Gundlach, and T. N. Jackson, Tech. Digest of IEDM 1998, IEEE, New York, 249 (1998).
-
(1998)
Tech. Digest of IEDM 1998
, pp. 249
-
-
Bonse, M.1
Thomasson, D.B.2
Klauk, H.3
Gundlach, D.J.4
Jackson, T.N.5
-
10
-
-
18744402718
-
-
R. Stewart, A. Chiang, A. Hermanns, F. Vicentini, J. Jacobsen, J. Atherton, E. Boling, F. Cuomo, P. Drzaic, and S. Pearson, Proc. SPIE - Int. Soc. Opt. Eng. 4712, 350 (2002).
-
(2002)
Proc. SPIE - Int. Soc. Opt. Eng.
, vol.4712
, pp. 350
-
-
Stewart, R.1
Chiang, A.2
Hermanns, A.3
Vicentini, F.4
Jacobsen, J.5
Atherton, J.6
Boling, E.7
Cuomo, F.8
Drzaic, P.9
Pearson, S.10
-
12
-
-
12844253137
-
-
http://www.iowathinfilm.com/technology/index.html.
-
-
-
-
13
-
-
12844286930
-
-
http://www.hamcontact.com/unisolar/engentek.html.
-
-
-
-
14
-
-
12844250060
-
-
http://www.fujielectric.co.jp/eng/company/tech/contents2002_05.html.
-
-
-
-
15
-
-
0000358828
-
-
F. Finger, P. Hapke, M. Luysberg, R. Carius, H. Wagner and M. Scheib, Appl. Phys. Lett., 65, 2588 (1994).
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 2588
-
-
Finger, F.1
Hapke, P.2
Luysberg, M.3
Carius, R.4
Wagner, H.5
Scheib, M.6
-
16
-
-
0031168978
-
-
M. Tzolov, F. Finger, R. Carius and P. Hapke, J. Appl. Phys., 81, 7376 (1997).
-
(1997)
J. Appl. Phys.
, vol.81
, pp. 7376
-
-
Tzolov, M.1
Finger, F.2
Carius, R.3
Hapke, P.4
-
17
-
-
0000624007
-
-
E. Vallat-Sauvain, U. Kroll, A. Shah and J. Pohl, J. Appl. Phys., 87, 3137 (2000).
-
(2000)
J. Appl. Phys.
, vol.87
, pp. 3137
-
-
Vallat-Sauvain, E.1
Kroll, U.2
Shah, A.3
Pohl, J.4
-
18
-
-
0001372536
-
-
M. Mulato, Y. Chen, S. Wagner and A. R. Zanatta, J. Non-Cryst. Solids, 266-269, 1260 (2000).
-
(2000)
J. Non-cryst. Solids
, vol.266-269
, pp. 1260
-
-
Mulato, M.1
Chen, Y.2
Wagner, S.3
Zanatta, A.R.4
-
20
-
-
0036772610
-
-
T. G. Bifano, H. T. Johnson, P. Bierden, and R. K. Mali, J. MEMS, 11, 592 (2002).
-
(2002)
J. MEMS
, vol.11
, pp. 592
-
-
Bifano, T.G.1
Johnson, H.T.2
Bierden, P.3
Mali, R.K.4
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