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Volumn 76, Issue 4, 2004, Pages 1114-1122

Quantitative X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry Characterization of the Components in DNA

Author keywords

[No Author keywords available]

Indexed keywords

IONS; OLIGOMERS; SECONDARY ION MASS SPECTROMETRY; STANDARDIZATION; SUGAR (SUCROSE); SYNTHESIS (CHEMICAL); X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 1242271246     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac034874q     Document Type: Article
Times cited : (94)

References (54)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.