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Volumn 51, Issue 2 II, 2003, Pages 665-668

AlGaN/GaN HEMTs - Operation in the K-band and above

Author keywords

GaN; High electron mobility transistor (HEMT); K band; Microwave noise; Microwave power

Indexed keywords

GALLIUM NITRIDE; MICROWAVES; SEMICONDUCTING ALUMINUM COMPOUNDS; SPURIOUS SIGNAL NOISE;

EID: 12244277387     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.807683     Document Type: Article
Times cited : (29)

References (13)
  • 8
    • 0029533607 scopus 로고
    • 0.15 μm InGaAs/AlGaAs/GaAs HEMT production process for high performance and high yield V-band power MMICs
    • R. Lai, M. Biedenbender, J. Lee, K. Tan, D. Streit, P. H. Liu, M. Hoppe, and B. Allen, "0.15 μm InGaAs/AlGaAs/GaAs HEMT production process for high performance and high yield V-band power MMICs," in GaAs IC Symp. Tech. Dig., 1995, pp. 105-108.
    • (1995) GaAs IC Symp. Tech. Dig. , pp. 105-108
    • Lai, R.1    Biedenbender, M.2    Lee, J.3    Tan, K.4    Streit, D.5    Liu, P.H.6    Hoppe, M.7    Allen, B.8
  • 11
    • 0033738001 scopus 로고    scopus 로고
    • The effect of surface passivation on the microwave characteristics of undoped AlGaN/GaN HEMT's
    • June
    • B. M. Green, K. K. Chu, E. M. Chumbes, J. A. Smart, J. R. Shealey, and L. F. Eastman, "The effect of surface passivation on the microwave characteristics of undoped AlGaN/GaN HEMT's," IEEE Electron Device Lett., vol. 21, pp. 268-270, June 2000.
    • (2000) IEEE Electron Device Lett. , vol.21 , pp. 268-270
    • Green, B.M.1    Chu, K.K.2    Chumbes, E.M.3    Smart, J.A.4    Shealey, J.R.5    Eastman, L.F.6
  • 13
    • 0035279282 scopus 로고    scopus 로고
    • Gallium nitride based high power heterojunction field effect transistors: Process development and present status at UCSB
    • Mar.
    • S. Keller, Y. F. Wu, G. Parish, N. Ziang, J. J. Xu, B. K. Keller, S. P. DenBaars, and U. K. Mishra, "Gallium nitride based high power heterojunction field effect transistors: Process development and present status at UCSB," IEEE Trans. Electron Devices, vol. 48, pp. 552-559, Mar. 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , pp. 552-559
    • Keller, S.1    Wu, Y.F.2    Parish, G.3    Ziang, N.4    Xu, J.J.5    Keller, B.K.6    Denbaars, S.P.7    Mishra, U.K.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.