An investigation of the TiO x-SiO 2/Mo(1 1 2) interface

Surface Science

Volumn 574, Issue 2-3, 2005, Pages 259-268

  Chen, M S ^a   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

High resolution electron energy loss spectroscopy (HREELS); Mixed oxides; Silica film; Surface structure morphology, roughness, and topography; Thin film; Titanium oxides

Indexed keywords

HIGH-RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY (HREELS); MIXED OXIDES; MOLECULAR ADSORPTION; SILICA FILMS;

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; MOLYBDENUM; OXIDATION; SILICA; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY; THIN FILMS; TITANIUM DIOXIDE;

SURFACE REACTIONS;

EID: 11344254674     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.10.036     Document Type: Article

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