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Volumn 366, Issue 3, 1996, Pages 556-563

Interface effects for metal oxide thin films deposited on another metal oxide III. SnO and SnO2 deposited on MgO(100) and the use of chemical state plots

Author keywords

Catalysis; Crystalline glass interfaces; Dielectric phenomena; Electron energy loss spectroscopy; Low energy ion scattering (LEIS); Magnesium oxides; Semiconductor insulator interfaces; Semiconductor metal oxide thin film structures; Surface electronic pheno

Indexed keywords

CATALYSIS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY GAP; INTERFACES (MATERIALS); MAGNESIA; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTING TIN COMPOUNDS; SILICA; SURFACE PHENOMENA; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030283260     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00832-1     Document Type: Article
Times cited : (40)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.