Interface effects for metal oxide thin films deposited on another metal oxide II. SnO2 deposited on SiO2

Surface Science

Volumn 366, Issue 3, 1996, Pages 545-555

  Jimenez V M ^a   Mejias J A ^a   Espinos J P ^a   Gonzalez Elipe A R ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

Catalysis; Crystalline glass interfaces; Dielectric phenomena; Electron energy loss spectroscopy; Low energy ion scattering (LEIS); Semiconductor insulator interfaces; Semiconductor metal oxide thin film structures; Silicon oxides

Indexed keywords

CATALYSIS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY GAP; INTERFACES (MATERIALS); SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTING TIN COMPOUNDS; SILICA; SURFACE PHENOMENA; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTALLINE GLASS INTERFACES; DIELECTRIC PHENOMENA; LOW ENERGY ION SCATTERING; TIN OXIDES;

SEMICONDUCTING FILMS;

EID: 0030283174     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00831-X     Document Type: Article

References (29)

1. D.W. Niles, D. Rioux and H. Höchst, J. Appl. Phys. 73 (1993) 4586.
2. R. Sanjinés, C. Coluzza, D. Rosenfeld, F. Gozzo, Ph. Alméras, F. Levy and G. Margaritondo, J. Appl. Phys. 73 (1993) 3997.
3. S. Semansik and R.E. Cavicchi, Thin Solid Films 206 (1991) 81.
4. D.F. Cox, T.B. Fryberger and S. Semancik, Phys. Rev. B 38 (1988) 2072.
5. T. Ishida, H. Kobayashi and Y. Nakato, J. Appl. Phys. 73(9) (1993) 4344.
6. R. Cavicchi, M. Tarlov and S. Semancik, J. Vac. Sci. Technol. A (1990) 2347.
7. A. Ben-Shalom, L. Kaplan, R.L. Boxman, S. Goldsmith and M. Nathan, Thin Sol. Films 236 (1993) 20.
8. V.M. Jiménez, A. Fernández, J.P. Espinós, A.R. González-Elipe, Surf. Sci. 350 (1996) 123.
9. G. Lassaletta, A. Fernández, J.P. Espinós and A.R. González-Elipe, J. Phys. Chem. 99 (1995) 1484.
10. D.F. Cox, T.B. Fryberger and S. Semancik, Phys. Rev. B 38 (1988) 2072.
11. R. Sanjinés, C. Coluzza, D. Rosenfeld, F. Gozzo, Ph. Almerés, F. Levy and G. Margaritondo, J. Appl. Phys. 73 (1993) 3997.
12. A.J. Bevolo, J.D. Verhoeven and M. Noack, Surf. Sci. 134 (1983) 499.
13. G.B. Hoflund and G.R. Corallo, Phys. Rev. B 46 (1992) 7110.
14. C.D. Wagner, Faraday Discuss. Chem. Soc. 60 (1975) 291.
15. R. Sanjinés, D. Rosenfeld, F. Gozzo, Ph. Alméras, L. Pérez, F. Lévy, G. Margaritondo and W.H. Schreiner, Surf. Interf. Anal. 22 (1994) 372.
16. D.A. Asbury and G.B. Hoflund, J. Vac. Sci. Technol. A 5 (1987) 1132.
17. J.-M. Themlin, M. Chtaïb, L. Henrard, P. Lambin, J. Darville and J.-M. Gilles, Phys. Rev. B 46 (1992) 2460.
18. L. Kövér, G. Moretti, Zs. Kovács, R. Sanjinés, I. Cserny, G. Margaritondo, J. Pálinkás and H. Adachi, J. Vac. Sci. Technol. A 13 (1995) 1382
19. J.-M. Themlin, M. Chtaïb, L. Henrard, Ph. Lambin, J. Darville and J.-M. Gilles, Phys. Rev. B 46 (1992) 2460.
20. G. Moretti, J. Electron Spectrosc. Relat. Phenom. 58 (1992) 105.
21. L. Köver, Zs. Kovács, R. Sanjinés, G. Moretti, I. Cserny, G. Margaritondo, J. Pálinkás and H. Adachi, Surf. Interface Anal. 23 (1995) 461.
22. T.D. Thomas, Electron Spectrosc. Relat. Phenom. 20 (1980) 117.
23. Z.M. Jarzebski and J.P. Marton, J. Electrochem. Soc. 123 (1976) 199c
24. B.W. Veal and A.P. Paulikas, Phys. Rev. B 31 (1985) 5399.
25. G. Moretti, Surf. Interface Anal. 16 (1990) 159.
26. G. Moretti, J. Electron Spectrosc. Relat. Phenom. 50 (1990) 289.
27. A.R. González-Elipe, G. Lassaletta, A. Fernández, V.M. Jiménez, L. Soriano and J.M. Sanz, unpublished results.
28. W.J. Stevens, M. Krauss, H. Basch and P.G. Jasien, Can. J. Chem. 70 (1992) 612.
29. A.E. Reed, R.B. Weinstock and F. Weinhold, J. Chem. Phys. 83 (1985) 735.