Growth and characterization of layered, binary thin-film oxides: MgO-NiO and CaO-NiO

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 3 pt 2, 1996, Pages 1395-1400

  Xu, C ^a   Oh, W S ^a   Guo, Q ^a   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; FILM GROWTH; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; OXIDES; TEMPERATURE PROGRAMMED DESORPTION; THERMODYNAMIC STABILITY; WETTING;

ION SCATTERING SPECTROSCOPY; NICKEL OXIDE; OVERLAYERS;

THIN FILMS;

EID: 0030144958     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.579960     Document Type: Article

References (21)