-
2
-
-
10844220223
-
-
V. Y. Davydov, A. A. Klochikhin, V. V. Emtsev, S. V. Ivanov, V. V. Vekshin, F. Bechstedt, J. Furthmüller, H. Harima, A. V. Mudryi, A. Hashimoto, A. Yamamoto, J. Aderhold, J. Graul, and E. E. Haller, Phys. Status Solidi B 230, R4 (2002).
-
(2002)
Phys. Status Solidi B
, vol.230
-
-
Davydov, V.Y.1
Klochikhin, A.A.2
Emtsev, V.V.3
Ivanov, S.V.4
Vekshin, V.V.5
Bechstedt, F.6
Furthmüller, J.7
Harima, H.8
Mudryi, A.V.9
Hashimoto, A.10
Yamamoto, A.11
Aderhold, J.12
Graul, J.13
Haller, E.E.14
-
3
-
-
21544477408
-
-
M. S. Brandt, N. M. Johnson, R. J. Molnar, R. Singh, and T. D. Moustakas, Appl. Phys. Lett. 64, 2264 (1994).
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 2264
-
-
Brandt, M.S.1
Johnson, N.M.2
Molnar, R.J.3
Singh, R.4
Moustakas, T.D.5
-
4
-
-
0001022760
-
-
W. Götz, N. M. Johnson, J. Walker, D. P. Bour, and R. A. Street, Appl. Phys. Lett 68, 667 (1996).
-
(1996)
Appl. Phys. Lett
, vol.68
, pp. 667
-
-
Götz, W.1
Johnson, N.M.2
Walker, J.3
Bour, D.P.4
Street, R.A.5
-
5
-
-
5344240387
-
-
O. Ambacher, M. S. Brandt, R. Dimitrov, T. Metzger, M. Stutzmann, R. A. Fischer, A. Miehr, A. Bergmaier, and G. Dollinger, J. Vac. Sci. Technol. B 14, 3532 (1996).
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 3532
-
-
Ambacher, O.1
Brandt, M.S.2
Dimitrov, R.3
Metzger, T.4
Stutzmann, M.5
Fischer, R.A.6
Miehr, A.7
Bergmaier, A.8
Dollinger, G.9
-
6
-
-
0037345314
-
-
G. Martinez-Criado, A. Cros, A. Cantarero, N. V. Joshi, O. Ambacher, and M. Stutzmann, Solid-State Electron. 47, 565 (2003).
-
(2003)
Solid-State Electron.
, vol.47
, pp. 565
-
-
Martinez-Criado, G.1
Cros, A.2
Cantarero, A.3
Joshi, N.V.4
Ambacher, O.5
Stutzmann, M.6
-
7
-
-
0031274694
-
-
A. Cros, R. Dimitrov, H. Angerer, O. Ambacher, M. Stutzmann, S. Christiansen, M. Albrecht, and H. P. Strunk, J. Cryst. Growth 181, 197 (1997).
-
(1997)
J. Cryst. Growth
, vol.181
, pp. 197
-
-
Cros, A.1
Dimitrov, R.2
Angerer, H.3
Ambacher, O.4
Stutzmann, M.5
Christiansen, S.6
Albrecht, M.7
Strunk, H.P.8
-
8
-
-
0037292511
-
-
K. Jacobs, B. Van Daele, M. R. Leys, I. Moerman, and G. Van Tendeloo, J. Cryst. Growth 248, 498 (2003).
-
(2003)
J. Cryst. Growth
, vol.248
, pp. 498
-
-
Jacobs, K.1
Van Daele, B.2
Leys, M.R.3
Moerman, I.4
Van Tendeloo, G.5
-
12
-
-
0942277773
-
-
T. M. Smeeton, M. J. Kappers, J. S. Barnard, M. E. Vickers, and C. J. Humphreys, Appl. Phys. Lett. 83, 5419 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 5419
-
-
Smeeton, T.M.1
Kappers, M.J.2
Barnard, J.S.3
Vickers, M.E.4
Humphreys, C.J.5
-
13
-
-
10844257843
-
-
This value may be even higher. The dimensions of the QDs are much smaller than the typical thickness of a TEM specimen. In reality, one measures the concentration averaged along the electron-beam direction
-
This value may be even higher. The dimensions of the QDs are much smaller than the typical thickness of a TEM specimen. In reality, one measures the concentration averaged along the electron-beam direction.
-
-
-
-
14
-
-
0001137412
-
-
N. Sharma, P. Thomas, D. Tricker, and C. J. Humphreys, Appl. Phys. Lett. 77, 1274 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 1274
-
-
Sharma, N.1
Thomas, P.2
Tricker, D.3
Humphreys, C.J.4
-
16
-
-
21544461089
-
-
K. Muraki, S. Fukatsu, Y. Shiraki, and R. Ito, Appl. Phys. Lett. 61, 557 (1992).
-
(1992)
Appl. Phys. Lett.
, vol.61
, pp. 557
-
-
Muraki, K.1
Fukatsu, S.2
Shiraki, Y.3
Ito, R.4
|