Analysis of vibrating mode scanning polarization force microscope

Review of Scientific Instruments

Volumn 75, Issue 11, 2004, Pages 4721-4726

  Chen, Yuhang ^a   Li, Xiaojun ^b   Zhou, Xingfei ^b   Sun, Jielin ^c   Huang, Wenhao ^a   Hu, Jun ^b,c  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; DIELECTRIC DEVICES; ELASTIC MODULI; ELECTRIC POTENTIAL; POLARIZATION; SCANNING; THIN FILMS; VAN DER WAALS FORCES;

BIAS VOLTAGE; HIGH-RESOLUTION IMAGES; THIN SOFT FILMS; VIBRATION MODE SCANNING POLARIZATION FORCE MICROSCOPE (VSPFM);

VIBRATION CONTROL;

EID: 10844254564     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1809264     Document Type: Article

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