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Volumn 472, Issue 1-2, 2005, Pages 31-36

Real-time analysis of wetting-layer evolution and island nucleation using spectroscopic ellipsometry with Tauc-Lorentz parametrization

(3) Osipov, A V a Schmitt, F a Hess, P a

a UNIVERSITY OF HEIDELBERG (Germany)

Author keywords

Ellipsometry; Nucleation; Quantum dots; Stranski Krastanow growth

Indexed keywords

ELLIPSOMETRY; FUNCTIONS; LATTICE CONSTANTS; NUCLEATION; OPTOELECTRONIC DEVICES; REAL TIME SYSTEMS; SEMICONDUCTOR QUANTUM DOTS; SPECTROSCOPIC ANALYSIS; STRESS ANALYSIS;

DIELECTRIC FUNCTIONS; MEAN SQUARED ERROR (MSE); SEMICONDUCTOR FILMS; STRANSKI-KRASTANOW GROWTH;

WETTING;

EID: 10044294834 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2004.06.102 Document Type: Article

Times cited : (18)

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