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Volumn 170, Issue 1-4, 1997, Pages 193-197
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In situ monitoring of CdTe nucleation on GaAs (100) using spectroscopic ellipsometry
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Author keywords
[No Author keywords available]
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Indexed keywords
ELLIPSOMETRY;
EPITAXIAL GROWTH;
MONITORING;
NUCLEATION;
SEMICONDUCTING CADMIUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR GROWTH;
CADMIUM TELLURIDE;
METALLORGANIC VAPOR PHASE EPITAXY;
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EID: 0030718245
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/s0022-0248(96)00610-0 Document Type: Article |
Times cited : (2)
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References (13)
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