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Volumn 170, Issue 1-4, 1997, Pages 193-197

In situ monitoring of CdTe nucleation on GaAs (100) using spectroscopic ellipsometry

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; EPITAXIAL GROWTH; MONITORING; NUCLEATION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH;

EID: 0030718245     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0022-0248(96)00610-0     Document Type: Article
Times cited : (2)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.