Role of Mobile Interstitial Oxygen Atoms in Defect Processes in Oxides: Interconversion between Oxygen-Associated Defects in SiO2 Glass

Physical Review Letters

Volumn 92, Issue 1, 2004, Pages 155041-155044

  Kajihara, Koichi ^a   Skuja, Linards ^a,b   Hirano, Masahiro ^a   Hosono, Hideo ^a,c  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b UNIVERSITY OF LATVIA   (Latvia)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AIR; ANNEALING; CHEMICAL BONDS; CRYSTAL DEFECTS; KRYPTON; OXYGEN; OZONE; PARAMAGNETISM; PHOTOLYSIS; QUANTUM THEORY; SILICA; SPECTROMETRY; STOICHIOMETRY; SYNTHESIS (CHEMICAL); VACUUM APPLICATIONS;

DANGLING BONDS; PEROXY RADICALS (POR);

GLASS;

EID: 1242284702     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (39)

1. E. P. O'Reilly and J. Robertson, Phys. Rev. B 27, 3780 (1983).
2. G. Pacchioni and G. Ierano, Phys. Rev. B 57, 818 (1998).
3. C. M. Nelson and R. A. Weeks, J. Appl. Phys. 32, 883 (1961).
4. H. Hosono, Y. Abe, H. Imagawa, H. Imai, and K. Arai, Phys. Rev. B 44, 12043 (1991).
5. M. Guzzi, M. Martini, A. Paleari, F. Pio, A. Vedda, and C. B. Azzoni, J. Phys. C 5, 8105 (1993).
6. E. A. Kotomin and A. I. Popov, Nucl. Instrum. Methods Phys. Res., Sect. B 141, 1 (1998).
7. G. Pacchioni and G. Ieranó, Phys. Rev. B 56, 7304 (1997).
8. D. R. Hamann, Phys. Rev. Lett. 81, 3447 (1998).
9. M. A. Szymanski, A. L. Shluger, and A. M. Stoneham, Phys. Rev. B 63, 224207 (2001).
10. L. Skuja, M. Hirano, K. Kajihara, and H. Hosono, Phys. Chem. Glasses 43C, 145 (2002).
11. K. Awazu and H. Kawazoe, J. Appl. Phys. 68, 3584 (1990).
12. L. Skuja, M. Hirano, and H. Hosono, Phys. Rev. Lett. 84, 302 (2000).
13. D. L. Griscom, J. Ceram. Soc. Jpn. 99, 923 (1991).
14. L. Skuja and B. Güttler, Phys. Rev. Lett. 77, 2093 (1996).
15. D. L. Griscom and M. Mizuguchi, J. Non-Cryst. Solids 239, 66 (1998).
16. L. Skuja, M. Hirano, H. Hosono, K. Kajihara, and A. Silin, Glass Sci. Technol.-Glastech. Ber. 75, 24 (2002).
17. M. Stapelbroek, D. L. Griscom, E. J. Friebele, and G. H. Sigel, Jr., J. Non-Cryst. Solids 32, 313 (1979).
18. E. J. Friebele, D. L. Griscom, M. Stapelbroek, and R. A. Weeks, Phys. Rev. Lett. 42, 1346 (1979).
19. 2 and Related Dielectrics: Science and Technology, NATO Science Series, edited by G. Pacchioni, L. Skuja, and D. L. Griscom (Kluwer Academic Publishers, Dordrecht, Netherlands, 2000), pp. 339-370.
20. H. Hosono and R. A. Weeks, J. Non-Cryst. Solids 116, 289 (1990).
21. A. H. Edwards and W. B. Fowler, Phys. Rev. B 26, 6649 (1982).
22. J. H. Stathis and M. A. Kastner, Phys. Rev. B 29, 7079 (1984).
23. T. E. Tsai and D. L. Griscom, Phys. Rev. Lett. 67, 2517 (1991).
24. T. R. Waite, Phys. Rev. 107, 463 (1957).
25. 2, edited by R. A B. Devine (Plenum, New York, 1988), p. 181.
26. R. A. B. Devine, J. J. Capponi, and J. Arndt, Phys. Rev. B 35, 770 (1987).
27. L. Zhang, V. A. Mashkov, and R. G. Leisure, Phys. Rev. Lett. 74, 1605 (1995).
28. L. Skuja, K. Kajihara, T. Kinoshita, M. Hirano, and H. Hosono, Nucl. Instrum. Methods Phys. Res., Sect. B 191, 127 (2002).
29. K. Kajihara, Y. Ikuta, M. Hirano, and H. Hosono, Appl. Phys. Lett. 81, 3164 (2002).
30. K. Kajihara, T. Miura, H. Kamioka, M. Hirano, L. Skuja, and H. Hosono, J. Non-Cryst. Solids (to be published).
31. -3 at the center [30].
32. L. Skuja, B. Güttier, D. Schiel, and A. R. Silin, Phys. Rev. B58, 14296 (1998).
33. 2 at 7.6 eV [4].
34. K. Kajihara, L. Skuja, M. Hirano, and H. Hosono, Phys. Rev. Lett. 89, 135507 (2002).
35. 4 tetrahedron, the thermal motion might dynamically degenerate its ground state and render it EPR silent.
36. 2-laser-induced POR (Fig. 3, point "before anneal"), whose concentration is notably close to that of the slow-bleaching FOR (Fig. 3, point at 200 pulses), might have different configuration from FOR created by thermal anneal. The slow-bleaching FOR likely has local environment, which hinders the separation of the atomic oxygen after photolysis ("cage effect").
37. 2 at 5.4 eV with full width at half maximum of 1.2 eV) [19].
38. P. D. Lightfoot, R. A. Cox, J. N. Crowley, M. Destriau, G. D. Hayman, M. E. Jenkin, G. K. Moortgat, and F. Zabel, Atmos. Environ. A 26, 1805 (1992).
39. D. Hartmann, J. Karthäuser, and R. Zellner, J. Phys. Chem. 94, 2963 (1990).