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Volumn 91, Issue 5, 2003, Pages 583011-583014

Lateral scaling in carbon-nanotube field-effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; CARRIER MOBILITY; GATES (TRANSISTOR); SCHOTTKY BARRIER DIODES;

EID: 0041416015     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (162)

References (19)
  • 11
    • 0042253269 scopus 로고    scopus 로고
    • At least for CNFETs with channel lengths of a few hundred nanometers or less
    • At least for CNFETs with channel lengths of a few hundred nanometers or less.
  • 17
    • 0043255734 scopus 로고    scopus 로고
    • note
    • Because of the unfavorable ratio of the gate length to gate oxide thickness for g3, there can be significant penetration of the neighboring gate fields under this segment. Thus, when segment g3 is swept alone, the device fails to turn off.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.