Device Physics at the Scaling Limit: What Matters?

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2003, Pages 789-792

  Lundstrom, Mark ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTATIONAL METHODS; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTROSTATICS; FERMI LEVEL; HIGH ELECTRON MOBILITY TRANSISTORS; LIGHT REFLECTION; LIGHT SCATTERING; MOLECULAR DYNAMICS; QUANTUM THEORY; SEMICONDUCTOR QUANTUM WIRES;

CHANNEL LENGTHS; ELECTROSTATIC POTENTIAL; TWO-DIMENSIONAL ELECTROSTATICS;

MOSFET DEVICES;

EID: 0842309728     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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