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Volumn , Issue , 2002, Pages 1-8

Explicit Computation of Performance as a Function of Process Variation

(1)  Scheffer, Lou a  

a NONE

Author keywords

Process variation; Static timing; Statistical timing; Yield

Indexed keywords

ALGORITHMS; MICROPROCESSOR CHIPS; STATISTICAL METHODS;

EID: 0141538211     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/589412.589413     Document Type: Conference Paper
Times cited : (23)

References (9)
  • 5
  • 8
    • 0031077147 scopus 로고    scopus 로고
    • Analysis and decomposition of spatial variation in integrated circuit processes and devices
    • Feb
    • B. Stine, D. Boning, and J. Chung. Analysis and decomposition of spatial variation in integrated circuit processes and devices. IEEE Transactions on Semiconductor Manufacturing, 10(1):24-41, Feb 1997.
    • (1997) IEEE Transactions on Semiconductor Manufacturing , vol.10 , Issue.1 , pp. 24-41
    • Stine, B.1    Boning, D.2    Chung, J.3
  • 9
    • 0034860918 scopus 로고    scopus 로고
    • Mis-match characterization of 1.8 v and 3.3 v devices in 0.18 micron mixed signal cmos technology
    • T.-H. Yeh, J. Lin, S.-C. Wong, H. Huang, and J. Sun. Mis-match characterization of 1.8 v and 3.3 v devices in 0.18 micron mixed signal cmos technology. In 2001 Microelectronics Test Structures, pages 77-82, 2001.
    • (2001) 2001 Microelectronics Test Structures , pp. 77-82
    • Yeh, T.-H.1    Lin, J.2    Wong, S.-C.3    Huang, H.4    Sun, J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.