Very-high-quality MgO(001) surfaces: Roughness, rumpling and relaxation

Surface Science

Volumn 401, Issue 2, 1998, Pages 227-235

  Robach, O ^a   Renaud, G ^a   Barbier, A ^a  

^a CEA GRENOBLE   (France)

Author keywords

Ion etching; Low index single crystal surface; Magnesium oxides; Morphology; Roughness and topography; Surface relaxation and reconstruction; Surface segregation; Surface structure; X ray scattering

Indexed keywords

ANNEALING; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; ELECTROMAGNETIC WAVE SCATTERING; ETCHING; ION BOMBARDMENT; MORPHOLOGY; RELAXATION PROCESSES; SINGLE CRYSTALS; SURFACE PHENOMENA; SURFACE ROUGHNESS; X RAY ANALYSIS;

GRAZING INCIDENCE X RAY SCATTERING; ION ETCHING; LOW INDEX SINGLE CRYSTALS; SURFACE RECONSTRUCTION; SURFACE RELAXATION; SURFACE SEGREGATION; SURFACE TOPOGRAPHY;

MAGNESIA;

EID: 0032050856     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)01082-0     Document Type: Article

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