Molecular Electronics on Silicon: An Ultrahigh Vacuum Scanning Tunneling Microscopy Study

Annals of the New York Academy of Sciences

Volumn 1006, Issue , 2003, Pages 227-234

  Guisinger, Nathan P ^a   Basu, Rajiv ^a   Baluch, Andrew S ^a   Hersam, Mark C ^a  

^a Northwestern University   (United States)

Author keywords

Charge transport measurements; Molecular electronics; Molecular wires; Negative differential resistance; Organic nanostructures; Self directed growth; Silicon; Styrene; TEMPO; Ultrahigh vacuum scanning tunneling microscopy

Indexed keywords

OXYGEN; PHENYL GROUP; PIPERIDINE DERIVATIVE; SILICON; STYRENE;

CHEMICAL BOND; CHEMISTRY; CONFERENCE PAPER; DESORPTION; ELECTRONICS; IMAGING; MEASUREMENT; MICROSCOPE; ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPY; VACUUM;

EID: 0347320479     PISSN: 00778923     EISSN: None     Source Type: Book Series    
DOI: 10.1196/annals.1292.015     Document Type: Conference Paper

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