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Volumn 2, Issue 8, 2002, Pages 807-810

Patterning of Vinylferrocene on H-Si(100) via Self-Directed Growth of Molecular Lines and STM-Induced Decomposition

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EID: 0038525489     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl025628h     Document Type: Article
Times cited : (148)

References (21)
  • 12
    • 0348106803 scopus 로고    scopus 로고
    • note
    • This is necessarily an upper bound to the true barrier, as the nature of our calculation does not account for dynamic effects, such as vibration, which will lower the barrier height.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.