Isolating, imaging, and electrically characterizing individual organic molecules on the Si(100) surface with the scanning tunneling microscope

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 18, Issue 4 I, 2000, Pages 1349-1353

  Hersam, M C ^a   Guisinger, N P ^a   Lyding, J W ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; HYDROGEN BONDS; LITHOGRAPHY; MOLECULAR DYNAMICS; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; VACUUM APPLICATIONS;

COPPER PHTHALOCYANINE; FEEDBACK CONTROLLED LITHOGRAPHY (FCL); MOLECULAR ELECTRONICS; NORBORNADIENE; ULTRAHIGH VACUUM SCANNING TUNNELING MICROSCOPY (UHVSTM);

SILICON WAFERS;

EID: 0034225015     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582352     Document Type: Article

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