Potential Vulnerability of Dynamic CMOS Logic to Soft Gate Oxide Breakdown

IEEE Electron Device Letters

Volumn 24, Issue 12, 2003, Pages 742-744

  Kaczer, B ^a   Groeseneken, G ^a  

^a IMEC   (Belgium)

Author keywords

Circuit reliability; Dielectric breakdown; MOSFET logic devices

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; LOGIC CIRCUITS; LOGIC GATES; MOSFET DEVICES;

CIRCUIT FAILURE; CIRCUIT RELIABILITY; NODE RETENTION;

CMOS INTEGRATED CIRCUITS;

EID: 0347131290     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2003.819912     Document Type: Article

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