Single-equation model for low and high voltage soft breakdown conduction

Microelectronics Reliability

Volumn 44, Issue 1, 2004, Pages 163-166

  Miranda, E ^a,b   Mallaina, E ^a  

^a UNIVERSIDAD DE BUENOS AIRES   (Argentina)

^b Facultad de Ciencias Naturales e Instituto M Lillo   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC MATERIALS; ELECTRIC CONDUCTANCE; EXTRAPOLATION; MOS CAPACITORS; POINT CONTACTS; QUANTUM THEORY; STATISTICAL METHODS; THRESHOLD VOLTAGE;

CIRCUIT SIMULATORS; PIECEWISE FUNCTION;

ELECTRIC BREAKDOWN;

EID: 0346151210     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00194-X     Document Type: Article

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