Post-radiation-induced soft breakdown conduction properties as a function of temperature

Applied Physics Letters

Volumn 79, Issue 9, 2001, Pages 1336-1338

  Cester, Andrea ^a   Paccagnella, Alessandro ^a   Suñé, Jordi ^b   Miranda, Enrique ^c  

^a UNIVERSITY OF PADOVA   (Italy)

^b UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^c UNIVERSIDAD DE BUENOS AIRES   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040752625     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1398329     Document Type: Article

References (8)

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2. A. Scarpa, A. Paccagnella, F. Montera, G. Ghibaudo, G. Pananakakis, G. Ghidini, and P. G. Fuochi, IEEE Trans. Nucl. Sci. 44, 1818 (1997).
3. M. Ceschia, A. Paccagnella, A. Cester, A. Scarpa, and G. Ghidini, IEEE Trans. Nucl. Sci. 45, 2375 (1998).
4. M. Ceschia, A. Paccagnella, S. Sandrin, G. Ghidini, J. Wyss, M. Lavalle, and O. Flament, IEEE Trans. Nucl. Sci. 47, 566 (2000).
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7. E. Miranda, J. Suñe, R. Rodriguez, M. Nafría, and X. Aymerich, IEEE Electron Device Lett. 20, 265 (1999).
8. J. Sũne and E. Miranda, Proc. IEEE International Electron Devices Meeting, 533 (2000).