Analysis of interfacial adhesion based on electrical contact resistance measurements

Journal of Applied Physics

Volumn 94, Issue 10, 2003, Pages 6386-6390

  Kogut, L ^a   Komvopoulos, K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTRIC RESISTANCE MEASUREMENT; ELECTROSTATICS; INTERFACES (MATERIALS); PLASTIC DEFORMATION; SUBSTRATES; SURFACE PHENOMENA; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY; VAN DER WAALS FORCES;

ADHESION ENERGY; ADHESION FORCE; ADHESION MEASUREMENTS;

ADHESION;

EID: 0344515502     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1618925     Document Type: Article

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