Aggressive test power reduction through test stimuli transformation

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 2003, Pages 542-547

  Sinanoglu, Ozgur ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC POWER SUPPLIES TO APPARATUS; LOGIC GATES; MATHEMATICAL MODELS; MATRIX ALGEBRA; VECTORS;

POWER REDUCTION; SCAN CHAIN MODIFICATION METHODOLOGY; TEST STIMULI TRANSFORMATION;

INTEGRATED CIRCUIT TESTING;

EID: 0344118916     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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