Input control technique for power reduction in scan circuits during test application

Proceedings of the Asian Test Symposium

Volumn , Issue , 1999, Pages 315-320

  Huang, Tsung Chu ^a   Lee, Kuen Jong ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

INPUT CONTROL TECHNIQUES; SCAN CIRCUITS;

ALGORITHMS; INTEGRATED CIRCUIT TESTING;

VLSI CIRCUITS;

EID: 0033347952     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (15)

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