Attack of the 'Holey Shmoos': a case study of advanced DFD and Picosecond Imaging Circuit Analysis (PICA)

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 883-891

  Huott, William ^a   McManus, Moyra ^a   Knebel, Daniel ^a   Steen, Steven ^a   Manzer, Dennis ^a   Sanda, Pia ^a   Wilson, Steven ^a   Chan, Yuen ^a   Pelella, Antonio ^a   Polonsky, Stanislav ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; CMOS INTEGRATED CIRCUITS; COMPUTER DEBUGGING; MICROPROCESSOR CHIPS; RANDOM ACCESS STORAGE; WAVEFORM ANALYSIS;

DESIGN FOR DIAGNOSTIC; HOLEY SHMOO PROBLEM; PICOSECOND IMAGING CIRCUITS ANALYSIS;

DESIGN FOR TESTABILITY;

EID: 0033326848     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)