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Volumn 45, Issue 6, 1999, Pages 539-550

Evanescent microwave probes and microscopy

Author keywords

Characterization of materials; Evanescent fields; Microscopy; Microwaves

Indexed keywords


EID: 0343978149     PISSN: 0035001X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (6)

References (47)
  • 3
    • 19044362545 scopus 로고
    • Phys. Rev. Lett. 50 (1983) 120.
    • (1983) Phys. Rev. Lett. , vol.50 , pp. 120
  • 8
    • 0024604960 scopus 로고
    • P.K. Hansma et al., Science 243 (1989) 641.
    • (1989) Science , vol.243 , pp. 641
    • Hansma, P.K.1
  • 15
    • 85022113189 scopus 로고    scopus 로고
    • European patent application no. 0112401, Dec. 27 1982; US patent 4 604 520, Dec. 20 1983
    • D. Pohl, European patent application no. 0112401, Dec. 27 1982; US patent 4 604 520, Dec. 20 1983.
    • Pohl, D.1
  • 16
    • 21044438952 scopus 로고    scopus 로고
    • (All articles in No. 1-4) Ultramicroscopy 71 (1998).
    • (1998) Ultramicroscopy , vol.71


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.