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Volumn 45, Issue 6, 1999, Pages 539-550
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Evanescent microwave probes and microscopy
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Author keywords
Characterization of materials; Evanescent fields; Microscopy; Microwaves
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Indexed keywords
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EID: 0343978149
PISSN: 0035001X
EISSN: None
Source Type: Journal
DOI: None Document Type: Review |
Times cited : (6)
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References (47)
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