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Volumn 20, Issue 11, 2003, Pages 2011-2014
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Analysing Imaging Signals of Negative-Charging Contrast in Scanning Electron Microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FIELDS;
ELECTRONS;
DYNAMICS CHARACTERISTIC;
ELECTRON SIGNALS;
IMAGE CONTRASTS;
INSULATING THIN FILMS;
LOCAL ELECTRIC FIELD;
NEGATIVE CHARGING;
NEGATIVELY CHARGED SURFACES;
SECONDARY ELECTRON IMAGING;
SECONDARY ELECTRONS;
SIMPLIFIED PROCEDURE;
SCANNING ELECTRON MICROSCOPY;
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EID: 0242659888
PISSN: 0256307X
EISSN: None
Source Type: Journal
DOI: 10.1088/0256-307X/20/11/031 Document Type: Article |
Times cited : (16)
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References (20)
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