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Volumn , Issue CIRCUITS SYMP., 2002, Pages 316-319

Leakage-biased domino circuits for dynamic fine-grain leakage reduction

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER CIRCUITS; CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; LEAKAGE CURRENTS; LOGIC DESIGN; LOGIC GATES;

EID: 0242526897     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (40)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.