Modeling and simulation of emissivity of silicon-related materials and structures

Journal of Electronic Materials

Volumn 32, Issue 10, 2003, Pages 1052-1058

  Ravindra, N M ^a   Ravindra, Krshna ^a,b   Mahendra, Sundaresh ^a   Sopori, Bhushan ^c   Fiory, Anthony T ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b Union County Magnet High School   (United States)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Emissivity; Hotliner; Si; SIMOX

Indexed keywords

COMPUTER SIMULATION; MATRIX ALGEBRA; RAY TRACING; REFLECTION; TEMPERATURE;

EMISSIVITY; EMITTANCE; HOTLINER; SEPARATION BY IMPLANTATION PF OXYGEN WAFERS; TRANSMITTANCE;

SEMICONDUCTING SILICON;

EID: 0242367999     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-003-0088-0     Document Type: Article

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