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Volumn 48, Issue 1, 2004, Pages 143-147

Transconductance frequency dispersion measurements on fully implanted 4H-SiC MESFETs

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCIES; HYDROGEN; SILICON CARBIDE; TRANSCONDUCTANCE;

FREQUENCY DISPERSION;

MESFET DEVICES;

EID: 0142217435 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/S0038-1101(03)00269-7 Document Type: Article

Times cited : (13)

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