Diagnosis of programmable interconnect systems: theory and application

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 204-209

  Huang, W K ^a   Chen, X T ^a   Lombardi, F ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK TOPOLOGY; ELECTRIC SWITCHES; ERROR DETECTION; FAILURE ANALYSIS; HIERARCHICAL SYSTEMS; LOGIC PROGRAMMING; MATHEMATICAL MODELS; OPTIMIZATION; VECTORS;

PROGRAMMABLE INTERCONNECT SYSTEMS; PROGRAMMING SEQUENCE;

LOGIC GATES;

EID: 0029710665     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)