Quantitative analysis of surface atom positions in a thick crystal as determined by a reconstructed exit wave

Journal of Electron Microscopy

Volumn 52, Issue 4, 2003, Pages 375-381

  Kawasaki, Tadahiro ^a   Taya, Masaki ^a   Takai, Yoshizo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Au (110) 2 x 1 reconstructed surface; Exit wave reconstruction; Surface atom position; Three dimensional Fourier filtering method; Through focus images; Transmission electron microscopy

Indexed keywords

ATOMS; CRYSTAL ATOMIC STRUCTURE; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; SURFACE RECONSTRUCTION;

ATOM POSITIONS; AU (110) 2 × 1 RECONSTRUCTED SURFACE; AU(110); EXIT WAVE RECONSTRUCTION; EXIT WAVES; FOURIER-FILTERING METHODS; RECONSTRUCTED SURFACES; SURFACE ATOM POSITION; SURFACE ATOMS; THREE-DIMENSIONAL FOURIER FILTERING METHOD; THROUGH-FOCUS IMAGE; WAVE RECONSTRUCTION;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 0142136598     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/52.4.375     Document Type: Article

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