Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum

Journal of Electron Microscopy

Volumn 50, Issue 5, 2001, Pages 405-412

  Kawasaki, Tadahiro ^a   Takai, Yoshizo ^a   Ikuta, Takashi ^b   Shimizu, Ryuichi ^c  

^a OSAKA UNIVERSITY   (Japan)

^b OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

^c OSAKA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Linear imaging component; Local area electron diffraction pattern; Three dimensional Fourier spectrum; Through focus images; Transmission electron microscopy

Indexed keywords

ARTICLE;

ABERRATIONS; DIFFRACTION PATTERNS; ELECTRONS; FOURIER TRANSFORMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE RECONSTRUCTION; SILICON WAFERS;

ELECTRON DIFFRACTION PATTERN; FOURIER SPECTRA; IMAGING COMPONENTS; LINEAR IMAGING; LINEAR IMAGING COMPONENT; LOCAL AREA ELECTRON DIFFRACTION PATTERN; LOCAL AREAS; SELECTED AREA ELECTRON DIFFRACTION PATTERN; THREE-DIMENSIONAL FOURIER SPECTRUM; THROUGH-FOCUS IMAGE;

INTERFEROMETRY;

EID: 0035681401     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/50.5.405     Document Type: Article

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