Cross-sectional high-resolution transmission electron microscopy observation of Si(113) 3 × 2 structure

Surface Science

Volumn 482-485, Issue PART 2, 2001, Pages 1385-1391

  Takeguchi, Masaki ^a   Tanaka, Miyoko ^a   Yasuda, Hidehiro ^a   Furuya, Kazuo ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Electron microscopy; High index single crystal surfaces; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

EID: 0000325680     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)00852-4     Document Type: Article

References (14)

1. T. Suzuki, Y. Tanishiro, H. Minoda, K. Yagi, M. Suzuki, Surf. Sci. 298 (1993) 473.
2. T. Suzuki, H. Minoda, Y. Tanishiro, K. Yagi, Surf. Sci. 348 (1996) 335.
3. W. Ranke, Phys. Rev. B 41 (1990) 5243.
4. J. Dabrowski, H.-J. Mussig, G. Wolff, Surf. Sci. 331-333 (1995) 1022.
5. J. Dabrowski, H.-J. Mussig, G. Wolff, Phys. Rev. Lett. 73 (1994) 1660.
6. H. Sakuma, D. Kunimatsu, M. Kageshima, A. Kawazu, Phys. Rev. B 53 (1996) 6927.
7. H. Hibino, T. Ogino, Phys. Rev. B 56 (1997) 4092.
8. K. Takayanagi, Y. Naitoh, Y. Oshima, M. Mitome, Surf. Rev. Lett. 4 (1997) 687.
9. K. Yagi, J. Electron. Microsc. 44 (1995) 269.
10. T. Suzuki, H. Minoda, Y. Tanishiro, K. Yagi, Surf. Rev. Lett. 5 (1998) 249.
11. N. Ikarashi, K. Kobayashi, H. Koike, H. Hasegawa, K. Yagi, Ultramicrosc. 26 (1988) 195.
12. T. Ichihashi, Jpn. J. Appl. Phys. 35 (1996) 6610.
13. T. Mishima, T. Osaka, Surf. Sci. 395 (1998) L256.
14. M. Takeguchi, Y. Wu, K. Furuya, Surf. Interf. Anal. 30 (2000) 288.