A histogram based AM-BIST algorithm for ADC characterization using imprecise stimulus

Midwest Symposium on Circuits and Systems

Volumn 2, Issue , 2002, Pages

  Parthasarathy, Kumar L ^a   Jin, Le ^a   Kuyel, Turker ^b   Chen, Degang ^a   Geiger, Randall ^a  

^a Iowa State University   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; NONLINEAR SYSTEMS;

NONLINEAR SIGNALS;

DIGITAL SIGNAL PROCESSING;

EID: 0036973644     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. M.Burns and G.W.Roberts, "An Introduction to Mixed-Signal IC Test and Measurement," Oxford University Press, New York, USA 2000.
2. Doernberg, J., Lee, H.S., and Hodges, D.A., "Full-Speed Testing of A/D Converters," IEEE J. Solid-State Circuits, December 1984, SC-19, pp.820-827.
3. J. Blair, Histogram measurement of ADC nonlinearities using sine waves, IEEE Trans. Instrum. Meas., Vol.43, pp.373-383, June 1994.
4. Kuyel, T., Linearity Testing Issues of Analog to Digital Converters, Test Conference, 1999. Proceedings, International, 1999, Page(s): 747-756.
5. K.L.Parthasarathy and R.L.Geiger, "Accurate Self Characterization and Correction of A/D Converter Performance", 2001 IEEE Midwest Symposium on Circuits and Systems, August 2001.
6. K.L.Parthasarathy, Le Jin, Degang Chen & R.L.Geiger, "A Modified Histogram Approach for Accurate Self-Characterization of Analog-to-Digital Converters", Proceedings of 2002 IEEE ISCAS, Arizona, May 2002.