Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 5, Issue , 2003, Pages

  Parthasarathy, Kumar L ^a   Jin, Le ^a   Kuyel, Turker ^c   Price, Dana ^b   Chen, Degang ^a   Geiger, Randall ^a  

^a Iowa State University   (United States)

^b MOTOROLA INC   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; PROBLEM SOLVING; SIGNAL GENERATORS;

HISTOGRAMS;

ANALOG TO DIGITAL CONVERSION;

EID: 0038420008     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. M.Burns and G.W.Roberts, "An Introduction to Mixed-Signal IC Test and Measurement," Oxford University Press, New York, USA 2000.
2. K.L.Parthasarathy, Le Jin, Degang Chen & R.L.Geiger, "A Modified Histogram Approach for Accurate Self-Characterization of Analog-to-Dlgital Converters", Proceedings of 2002 IEEE ISCAS, Arizona, May 2002.
3. K.L.Parthasarathy, Le Jin, Turker Kuyel, Degang Chen & R. L. Geiger, "A Histogram Based AM-BIST Algorithm for ADC Characterization using Imprecise Stimulus", Proceedings of the 2002 IEEE MWSCAS, Aug 2002.