Accurate self characterization and correction of A/D converter performance

Midwest Symposium on Circuits and Systems

Volumn 1, Issue , 2001, Pages 276-279

  Parthasarathy, Kumar L ^a   Geiger, Randall ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ANALOG TO DIGITAL CONVERSION; BUILT-IN SELF TEST; NONLINEAR NETWORKS;

CODE DENSITY TEST; INTEGRAL NONLINEARITY;

INTEGRATED CIRCUIT TESTING;

EID: 0035574507     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Full-speed testing of A/D converters
2. Reliability of code density test for high resolution ADCs
3. Histogram measurement of ADC nonlinearities using sine waves
4. Linearity testing issues of analog to digital converters