Algebraic method for delay fault testing

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 308-315

  Crepaux Motte, Sophie ^a   Jacomino, Mireille ^a   David, Rene ^a  

^a GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGEBRA; COMBINATORIAL CIRCUITS; COMPUTER HARDWARE; FAILURE ANALYSIS; FUNCTIONS; LOGIC GATES; MATHEMATICAL MODELS; RANDOM PROCESSES; SEQUENTIAL CIRCUITS; VECTORS;

DELAY FAULT TESTING; RANDOM TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0029721860     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)